師資人員	首頁師資人員專任教師

潘敏俊 教授　Pan, Min-Chun 辦公室： (Office) E4-465 專線電話： (Tel) 03-4267312 校內分機： (Campus Extension) 34312 傳真電話: (Fax) 03-4254501 E-mail： pan_minc@cc.ncu.edu.tw

論文著作 (Publications) 【下載完整著作目錄】

題目 作者姓名 期刊名稱 出版 年份 期別及 起訖頁數 期別種類 Irregular Bone Defect Detection and Device on Dental Implants H.-B. Zhuang and M.-Ch. Pan Journal of Medical Devices, Transactions of the ASME 2010 Vol. 4, Issue 2, 027521. Thermal Deformation Characterization on the Panel of TFT-LCD TV (II) - Solutions to Thermal-Induced Extrusion Degrading Image Quality Ch.-Y. Chu and M.-Ch. Pan* Journal of the Society for Information Display 2010 Vol. 18 (5), pp.357-367. Fluid-induced Instability Elimination of Rotor-Bearing System with an Electromagnetic Exciter Ch.-Ch. Fan and M.-Ch. Pan* International Journal of Mechanical Sciences 2010 Vol. 52, pp. 581-589. Rapid Convergence to the Inverse Solution Regularized with Lorentzian Distributed Function for Near Infrared Continuous Wave Diffuse Optical Tomography M.-Cheng Pan and M.-Chun Pan* Journal of Biomedical Optics 2010 Vol. 15(1), 016014. Effective Thermal Emission on TFT-LCD TV Panels for Improving Image Quality Chung-Yi Chu and Min-Chun Pan* Advances in Engineering Software 2010 Vol. 41, pp.130-140. Extended Angular-Velocity Vold-Kalman Order Tracking M.-Ch. Pan and Ch.-X. Wu Journal of Dynamic Systems Measurement and Control-Transactions of the ASME 2010 Vol.132 (3), 031001. Adaptive Hybrid Tracking-Error Control for DVD Drives in Vehicle Systems M.-Ch. Pan and Ch. Chien Microsystem Technologies 2010 Vol.16, Issues 1-2, pp.279-286. Near Infra-red Tomographic Imaging System Based on a Highly Angular Spatial-Resolution Mechanism－ Design, Calibration, and Performance M.-Chun Pan, Ch.-H. Chen, M.-Cheng Pan and Y.-M. Shyr Measurement 2009 Vol.42, Issue 3, pp.377-389. Thermal Deformation Characterization on the Panel of TFT-LCD TV (I)- Mechanism of Color Distortion Ch.-Y. Chu, Chih-Po Chan and M.-Ch. Pan* Journal of the Society for Information Display 2009 Vol.17, Issue 8, pp.635-645. Remote Online Machine Condition Monitoring System M.-Ch. Pan, P.-Ch. Lee and Y.-R. Cheng Measurement 2008 Vol.41, Issue 8, pp.912-921.

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