題目 |
作者姓名 |
期刊名稱 |
出版
年份 |
期別及
起訖頁數 |
期別種類 |
Thickness and optical constants measurement of thin film growth with circular heterodyne interferometry |
C. C. Hsu, J. Y. Lee, and D. C. Su |
Thin Solid Films |
2005 |
Vol. 491, pp. 91-95 |
|
Improved common-path optical heterodyne interferometer for measuring small optical rotation angle of chiral medium |
J. Y. Lee*, and D. C. Su |
Optics Communications |
2005 |
Vol. 256, pp.337-341 |
|
Non-ambiguous measurement of disk/slider spacing and effective optical constants with circular heterodyne interferometry |
C C. Hsu, and J. Y. Lee |
Optics Communications |
2004 |
Vol. 241, pp.137-143 |
|
Two-Wave Mixing Interferometer for Ultrasonic NDT in Defect Detection |
C. H. Ho, J. Y. Lee, H. C. Shih, J. H. Shaw, and Y. H. Liu |
Key Engineering Materials |
2004 |
Vols. 270-273, pp.359-363 |
|
Central fringe identification by phase quadrature interferometeric technique and tunable laser-diode |
J. Y. Lee, and D. C. Su |
Optics. Communications |
2001 |
Vol. 198, pp.333-337 |
|
Measurements of material refractive indices using heterodyne interferometry |
D. C. Su, J. Y. Lee, C. C. Hsu, and M. H. Chiu |
Interferometry in Speckle Light |
2000 |
pp. 519-526 |
|
Complex Refractive Index Measurement Based on Fresnel’s Equations and the Uses of Heterodyne Interferometry |
M. H. Chiu, J. Y. Lee and D. C. Su |
Applied Optics |
1999 |
Vol. 38, pp.4047-4052 |
|
Vacuum Measurement using Total-Internal-Reflection Heterodyne Interferometry |
M. H. Chiu, J. Y. Lee, D. C. Su and K. H Lee |
Precision Eng |
1999 |
Vol. 23, pp.260-263 |
|
Common-Path Heterodyne Interferometric Detection Scheme for Measuring Wavelength shift |
J. Y. Lee and D. C. Su |
Optics. Communications |
1999 |
Vol. 162, pp.7-10 |
|
A Method for Measuring Brewster’s Angle by Circularly Polarized Heterodyne Interferometry |
J. Y. Lee and D. C. Su |
Journal of Optics |
1998 |
Vol. 29, pp. 349-33 |
|