帳號
密碼
 
師資人員   首頁師資人員專任教師

李朱育 教授暨系副主任 Lee, Ju-Yi
辦公室:
(Office)
E2-403
專線電話:
(Tel)
03-4267307
校內分機:
(Campus Extension)
34307
傳真電話:
(Fax)
03-4254501
E-mail: juyilee@ncu.edu.tw

論文著作 (Publications)下載完整著作目錄
題目 作者姓名 期刊名稱 出版
年份
期別及
起訖頁數
期別種類
Thickness and optical constants measurement of thin film growth with circular heterodyne interferometry C. C. Hsu, J. Y. Lee, and D. C. Su Thin Solid Films 2005 Vol. 491, pp. 91-95
Improved common-path optical heterodyne interferometer for measuring small optical rotation angle of chiral medium J. Y. Lee*, and D. C. Su Optics Communications 2005 Vol. 256, pp.337-341
Non-ambiguous measurement of disk/slider spacing and effective optical constants with circular heterodyne interferometry C C. Hsu, and J. Y. Lee Optics Communications 2004 Vol. 241, pp.137-143
Two-Wave Mixing Interferometer for Ultrasonic NDT in Defect Detection C. H. Ho, J. Y. Lee, H. C. Shih, J. H. Shaw, and Y. H. Liu Key Engineering Materials 2004 Vols. 270-273, pp.359-363
Central fringe identification by phase quadrature interferometeric technique and tunable laser-diode J. Y. Lee, and D. C. Su Optics. Communications 2001 Vol. 198, pp.333-337
Measurements of material refractive indices using heterodyne interferometry D. C. Su, J. Y. Lee, C. C. Hsu, and M. H. Chiu Interferometry in Speckle Light 2000 pp. 519-526
Complex Refractive Index Measurement Based on Fresnel’s Equations and the Uses of Heterodyne Interferometry M. H. Chiu, J. Y. Lee and D. C. Su Applied Optics 1999 Vol. 38, pp.4047-4052
Vacuum Measurement using Total-Internal-Reflection Heterodyne Interferometry M. H. Chiu, J. Y. Lee, D. C. Su and K. H Lee Precision Eng 1999 Vol. 23, pp.260-263
Common-Path Heterodyne Interferometric Detection Scheme for Measuring Wavelength shift J. Y. Lee and D. C. Su Optics. Communications 1999 Vol. 162, pp.7-10
A Method for Measuring Brewster’s Angle by Circularly Polarized Heterodyne Interferometry J. Y. Lee and D. C. Su Journal of Optics 1998 Vol. 29, pp. 349-33

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