題目 |
作者姓名 |
期刊名稱 |
出版
年份 |
期別及
起訖頁數 |
期別種類 |
Development of an Angular Displacement Measurement by Birefringence Heterodyne Interferometry |
Lin-Yu Chen, Ju-Yi Lee, Hung-Sheng Chang, Yang Yang |
Smart Science |
2015 |
Vol. 3, pp. 188-192 |
SCI |
Thin-Film Growth Rate Monitor by Normal-Incidence Reflectance |
Fu-Rong Huang, Xu-Dong Chen, Chun-Cheng Wang, Ju-Yi Lee |
Key Engineering Materials |
2015 |
Vol. 656, pp. 107-112 |
|
Wavelength-modulated heterodyne grating shearing interferometry for precise displacement measurement |
Hung-Lin Hsieh, Ju-Yi Lee, Yu-Che Chung |
Advanced Optical Technologies |
2014 |
Vol. 3, pp. 395-400 |
|
Displacement measurement using a wavelength-phase-shifting grating interferometer |
J.Y. Lee, G.A. Jiang |
Optics Express |
2013 |
Vol. 21, pp. 25553-25564 |
|
Heterodyne common-path grating interferometer with Littrow configuration |
C.C. Wu, C.C. Hsu, J.Y. Lee, Y.Z. Chen |
Optics Express |
2013 |
Vol. 21, pp. 13322-13332 |
|
Measurement of Refractive Index Variation by Differential Surface Plasmon Resonance Technique |
J.Y. Lee, W.S. Gu |
OPTICAL REVIEW |
2013 |
Vol. 20, pp. 182-184 |
|
Littrow-type self-aligned laser encoder with high tolerance using double diffractions |
C.C. Wua, C.C. Hsu, J.Y. Lee, Y.Z. Chen, J.S. Yang |
OPTICS COMMUNICATIONS |
2013 |
Vol. 297, pp. 89–97 |
|
Enhanced Sensitivity to Surface Plasmon Resonance Phase in Wavelength- Modulated Heterodyne Interferometry. |
JY Lee, LW Mai, CC Hsu, YY Sung |
OPTICS COMMUNICATIONS |
2013 |
Vol. 289, pp. 28–32 |
|
Enhanced Sensitivity to Surface Plasmon Resonance Phase in Wavelength-Modulated |
Ju-Yi Lee, Li-Wei Mai, Cheng-Chih Hsu and Yuan-Yuan Sung |
Optics Communications |
2012 |
Vol 289, pp. 28–32 |
|
Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry |
Ju-Yi Lee, Ming-Pei Lu, Kun-Yi Lin and Szu-Han Huang |
Applied Optics |
2012 |
Vol. 51, pp. 1095-1100 |
|
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