題目 |
作者姓名 |
期刊名稱 |
出版
年份 |
期別及
起訖頁數 |
期別種類 |
Surface Plasmon Resonance Bio-Sensor with Full Field Phase Detection |
J.Y. Lee*, T.K. Chou, H.C. Shih, C.C. Hsu |
Key Engineering Materials |
2008 |
Vol. 381-382, pp 349-352 |
|
3D Displacement Measurement with Pico-meter Resolution using Single Heterodyne Grating Interferometry |
C.C. Hsu, J.Y. Lee, C.C. Wu, H.C. Shih |
Key Engineering Materials |
2008 |
Vol. 381-382, pp 283-286 |
|
Optical Heterodyne Laser Encoder with Sub-nanometer Resolution |
C. C. Wu, C. C. Hsu, J. Y. Lee*, H. Y. Chen, C. L. Dai |
Meas. Sci. Technol |
2008 |
Vol. 19, pp.045305 |
|
Reflection type heterodyne grating interferometry for in-plane displacement measurement |
C. C. Hsu, C. C. Wu, J. Y. Lee , H. Y. Chen, H. F. Weng |
Optics Communications |
2008 |
Vol. 281, pp.2582-2589 |
|
A phase quadrature interferometer for measuring the small optical rotation angle of a chiral medium |
J. Y. Lee*, and S. S. Cai |
Optics Communications |
2008 |
Vol .281, pp.2735–2739 |
|
Polarization interferometric surface plasmon resonance imaging system |
J. Y. Lee*, T. K. Chou, H. C. Shih |
Optics Letters |
2008 |
Vol. 33, pp. 434-436 |
|
Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry |
J. Y. Lee*, H. C. Shih, C. T Hong and T. K. Chou |
Optics Communications |
2007 |
Vol. 276, pp.283–287 |
|
Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution |
J. Y. Lee*, H. Y. Chen, C. C. Hsu, and C. C. Wu |
Sensors and actuators A |
2007 |
Vol. 137, pp.185–191 |
|
Heterodyne interferometer for measurement of in-plane displacement with subnanometer resolution |
J. Y. Lee*, H. Y Chen, C. C. Hsu and C. C Wu |
Proc. of SPIE |
2006 |
Vol. 6280, 62800J |
|
Applying an interferometric exposure model to analyze the influences of process parameters on the linewidth |
C. W. Chien, J. C. Chen, and J. Y. Lee |
Applied optics |
2006 |
Vol. 45, No. 32, pp. 8278-8287 |
|