師資人員	首頁師資人員專任教師

利定東 教授　Li Ting Tung 辦公室： (Office) E2-204 專線電話： (Tel) x 校內分機： (Campus Extension) x 傳真電話: (Fax) 03-4254501 E-mail： tomili@ncu.edu.tw

論文著作 (Publications)

題目 作者姓名 期刊名稱 出版 年份 期別及 起訖頁數 期別種類 Investigation of intrinsic hydrogenated amorphous silicon (a-Si:H) thin films on textured silicon substrate with high quality passivation Min-Lun Yu, Yu-Lin Hsieh, Sheng-Kai Jou Tomi T. Li* and Chien-Chieh Lee IEEE Xplore, (CSTIC2017) 2017 pp 1-3 Investigation of a Simplified Mechanism Model for Prediction of Gallium Nitride Thin Film Growth through Numerical Analysis Chih-Kai Hu ,Chun-Jung Chen,Ta-Chin Wei ,Tomi T. Li *,Ching-Chiun Wang and Chih-Yung Huang Coatings 2017 7(3), pp. 43-66. Numerical Verification of Gallium Nitride Thin-Film Growth in a Large MOCVD Reactor Chih-Kai Hu, Chun-Jung Chen, Ta-Chin Wei, Tomi T. Li *, Chih-Yung Huang , Chu-Li Chao, Yi-Jiun Lin Coatings 2017 7(8), pp.112-121. Structural and electrical investigations of a-Si:H(i) and a-Si∶H(n+) stacked layers for improving the interface and passivation qualities Yu-Lin Hsieh, Chien-Chieh Lee, Chia-Cheng Lu, Yiin-Kuen Fuh, Jenq-Yang Chang, Ju-Yi Lee and Tomi T. Li* J. of Photonics for Energy 2017 7(3),035503 An Optimization Mechanism for Gallium Nitride Thin Film by using the Numerical Analysis in Blue-LED Process Chih-Kai Hu, Chun-Jung Chen, Ta-Chin Wei, Ting-Tung Li* International Journal of Engineering and Advanced Research Technology 2016 2(6), pp 24-29 The plasma diagnosis by optical emission spectroscopy for the study of phosphorus doped nanocrystalline silicone film growth Hsiang-Chih Yu, Yu-Lin Hsieh, Chia-Cheng Lu, Chien-Chieh Lee, Jenq-Yang Chang , I-Chen Chen and Tomi T. Li* IEEE Xplore, (CSTIC2016) 2016 pp 1-3 Investigation of localized surface plasmon enhancement on organic light emitting diode by numerical analysis in 3D model Jyue-Ru Chen, Wan-Jung Yang, An-Chi Wei, Tomi T. Li* IEEE Xplore, (CSTIC2016) 2016 pp 1-3 The design of two-zone heater for a MOCVD vacuum reactor Cheng-Pin Chang, Chih-Kai Hu, Hsien-Chih Chiu and Tomi T. Li* IEEE Xplore, (CSTIC2016) 2016 pp 1-3 A Simplified and Universal Mechanism Model for Prediction of Gallium Nitride Thin Film Growth Through Numerical Analysis C.K. Hu, C.J. Chen, T.C. Wei, Tomi T. Li*, C. C. Wang, C. Y. Huang and Y.J. Lin International Journal of New Technology and Research (IJNTR) 2016 2(7), pp7-15 Doping profile control of epitaxial-like Si emitting layer for the application of c-Si solar cells Chien-Chieh Lee, Yu-Lin Hsieh, Tomi T. Li* and Jenq-Yang Chang IEEE Xplore,(23rd AMFPD) 2016 pp 225 - 227.

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